The total ionizing dose effects of X-ray irradiation on graphene/Si Schottky diodes with a HfO2 insertion layer
| Autor: | Xu, Yannan, Bi, Jinshun, Li, Yudong, Xi, Kai, Fan, Linjie, Liu, Ming, Sandip, M., Luo, Li |
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| Zdroj: | In Microelectronics Reliability September 2019 100-101 |
| Databáze: | ScienceDirect |
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