A new method for small sample space components screening: Challenges, algorithms and a case-study with Microchip
| Autor: | Archimbaud, A., Bergeret, F., D'Alberto, S., Bonnin, C., Soual, C. |
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| Zdroj: | In Microelectronics Reliability September 2019 100-101 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect