Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure
| Autor: | Pierścińska, D., Pierściński, K., Sobczak, G., Gutowski, P., Płuska, M., Bugajski, M. |
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| Zdroj: | In Microelectronics Reliability August 2019 99:113-118 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect