Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries
| Autor: | Grillon, Nathanaël, Bouyssou, Émilien, Jacques, Sébastien, Gautier, Gaël |
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| Zdroj: | In Microelectronics Reliability February 2019 93:102-108 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect