Stability of pentacene-based top gate thin film transistor with thick parylene as dielectric under humid environment

Autor: Diallo, Abdou Karim, Seck, Mané, Ly, El Hadji Babacar, Erouel, Mohsen, Ndiaye, Diene
Zdroj: In Microelectronics Reliability December 2019 103
Databáze: ScienceDirect