Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations
| Autor: | Joshy, Salil, Verdingovas, Vadimas, Jellesen, Morten Stendahl, Ambat, Rajan |
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| Zdroj: | In Microelectronics Reliability February 2019 93:81-88 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect