Review of shelf life evaluation methods and a physics of failure approach for shelf life estimation for electronic components
| Autor: | Li, Nga Man Jennifa, Das, Diganta, McCluskey, Patrick |
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| Zdroj: | In Microelectronics Reliability August 2019 99:152-160 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect