New perspectives in defect centric model for NBTI reliability
| Autor: | Nouguier, D., Ghibaudo, G., Federspiel, X., Rafik, M., Roy, D. |
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| Zdroj: | In Microelectronics Reliability July 2019 98:119-123 |
| Databáze: | ScienceDirect |
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| Autor: | Nouguier, D., Ghibaudo, G., Federspiel, X., Rafik, M., Roy, D. |
|---|---|
| Zdroj: | In Microelectronics Reliability July 2019 98:119-123 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect