Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
| Autor: | Kawahara, C., Wada, Y., Kinouchi, S., Kobayashi, H. |
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| Zdroj: | In Microelectronics Reliability September 2018 88-90:957-960 |
| Databáze: | ScienceDirect |
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