Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology
| Autor: | Maciel, N., Marques, E.C., Naviner, L.A.B., Cai, H. |
|---|---|
| Zdroj: | In Microelectronics Reliability September 2018 88-90:965-968 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Maciel, N., Marques, E.C., Naviner, L.A.B., Cai, H. |
|---|---|
| Zdroj: | In Microelectronics Reliability September 2018 88-90:965-968 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect