Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale

Autor:	Girard, M., Dubois, T., Hoffmann, P., Duchamp, G.
Zdroj:	In Microelectronics Reliability September 2018 88-90:914-919
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect