On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
| Autor: | Pagnano, Dario, Longobardi, Giorgia, Udrea, Florin, Sun, Jinming, Imam, Mohamed, Garg, Reenu, Kim, Hyeongnam, Charles, Alain |
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| Zdroj: | In Microelectronics Reliability September 2018 88-90:610-614 |
| Databáze: | ScienceDirect |
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