A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
| Autor: | Ferreira de Paiva Leite, Thiago, Fesquet, Laurent, Possamai Bastos, Rodrigo |
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| Zdroj: | In Microelectronics Reliability September 2018 88-90:122-127 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect