Measure of high frequency input impedance to study the instability of power devices in short circuit
| Autor: | Abbate, C., Busatto, G., Sanseverino, A., Tedesco, D., Velardi, F. |
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| Zdroj: | In Microelectronics Reliability September 2018 88-90:540-544 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect