Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
| Autor: | Della Marca, V., Postel-Pellerin, J., Kempf, T., Regnier, A., Chiquet, P., Bocquet, M. |
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| Zdroj: | In Microelectronics Reliability September 2018 88-90:159-163 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect