Bias temperature instability and condition monitoring in SiC power MOSFETs
| Autor: | Ortiz Gonzalez, J., Alatise, O. |
|---|---|
| Zdroj: | In Microelectronics Reliability September 2018 88-90:557-562 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Ortiz Gonzalez, J., Alatise, O. |
|---|---|
| Zdroj: | In Microelectronics Reliability September 2018 88-90:557-562 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect