Normalized differential conductance to study current conduction mechanisms in MOS structures
| Autor: | Nouibat, T.H., Messai, Z., Chikouch, D., Ouennoughi, Z., Rouag, N., Rommel, M., Frey, L. |
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| Zdroj: | In Microelectronics Reliability December 2018 91 Part 2:183-187 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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