Comphy — A compact-physics framework for unified modeling of BTI
| Autor: | Rzepa, G., Franco, J., O’Sullivan, B., Subirats, A., Simicic, M., Hellings, G., Weckx, P., Jech, M., Knobloch, T., Waltl, M., Roussel, P.J., Linten, D., Kaczer, B., Grasser, T. |
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| Zdroj: | In Microelectronics Reliability June 2018 85:49-65 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect