DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors
Autor: | Hasegawa, K. a, ⁎, Tsuzaki, K. a, Nishizawa, S. b |
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Zdroj: | In Microelectronics Reliability April 2018 83:115-118 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Hasegawa, K. a, ⁎, Tsuzaki, K. a, Nishizawa, S. b |
---|---|
Zdroj: | In Microelectronics Reliability April 2018 83:115-118 |
Databáze: | ScienceDirect |
Externí odkaz: |