Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes
| Autor: | Jia, Yunpeng, Lin, Zhenhua, Hu, Dongqing, Wu, Yu, Li, Peng, Liu, Guanghai |
|---|---|
| Zdroj: | In Microelectronics Reliability March 2018 82:37-41 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect