Fast identification of true critical paths in sequential circuits
| Autor: | Ubar, Raimund, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Jürimägi, Lembit |
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| Zdroj: | In Microelectronics Reliability February 2018 81:252-261 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect