Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs
| Autor: | Chiu, Hsien-Chin, Chou, Min-Li, Cheng, Chun-Hu, Kao, Hsuan-Ling, Cho, Cheng-Lin |
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| Zdroj: | In Microelectronics Reliability November 2017 78:267-271 |
| Databáze: | ScienceDirect |
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