Analysis of multifinger power HEMTs supported by effective 3-D device electrothermal simulation

Autor: Chvála, Aleš, Marek, Juraj, Príbytný, Patrik, Šatka, Alexander, Stoffels, Steve, Posthuma, Niels, Decoutere, Stefaan, Donoval, Daniel
Zdroj: In Microelectronics Reliability November 2017 78:148-155
Databáze: ScienceDirect