Probabilistic fatigue damage estimation of embedded electronic solder joints under random vibration
| Autor: | Jannoun, Mayssam, Aoues, Younes, Pagnacco, Emmanuel, Pougnet, Philippe, El-Hami, Abdelkhalak |
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| Zdroj: | In Microelectronics Reliability November 2017 78:249-257 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect