Model of phonon contribution to nonionizing energy loss (NIEL) for InP/InGaAs heterojunction
| Autor: | Zhao, Xiao-Hong, Lu, Hong-Liang, Zhang, Yu-Ming, Zhang, Yi-Men |
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| Zdroj: | In Microelectronics Reliability November 2017 78:156-160 |
| Databáze: | ScienceDirect |
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