A calculation method to estimate single event upset cross section
| Autor: | Wrobel, F., Touboul, A.D., Pouget, V., Dilillo, L., Boch, J., Saigné, F. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:644-649 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect