Characterization of Low Drop-Out during ageing and design for yield
| Autor: | Lajmi, R., Cacho, F., Lauga Larroze, E., Bourdel, S., Benech, P., Huard, V., Federspiel, X. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:92-96 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect