Electrical properties of SiNx films with embedded CNTs for MEMS capacitive switches

Autor: Koutsoureli, M., Stavrinidis, G., Birmpiliotis, D., Konstantinidis, G., Papaioannou, G.
Zdroj: In Microelectronics Reliability September 2017 76-77:614-618
Databáze: ScienceDirect