Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect
| Autor: | Neo, S.P., Quah, A.C.T., Ang, G.B., Nagalingam, D., Ma, H.H., Ting, S.L., Soo, C.W., Chen, C.Q., Mai, Z.H., Lam, J.C. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:255-260 |
| Databáze: | ScienceDirect |
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