Prediction of LIN communication robustness against EFT events using dedicated failure models
| Autor: | Escudié, F., Caignet, F., Nolhier, N., Bafleur, M. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:685-691 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect