True dose rate physical mechanism of ELDRS effect in bipolar devices

Autor: Pershenkov, V.S., Petrov, A.S., Bakerenkov, A.S., Ulimov, V.N., Felytsyn, V.A., Rodin, A.S., Belyakov, V.V., Telets, V.A., Shurenkov, V.V.
Zdroj: In Microelectronics Reliability September 2017 76-77:703-707
Databáze: ScienceDirect