Phase separation-suppressed and strain-modulated improvement of crystalline quality of AlGaN epitaxial layer grown by MOCVD

Autor: Luong, Tien Tung, Ho, Yen-Teng, Wong, Yuen-Yee, Chang, Shane, Chang, Edward-Yi
Zdroj: In Microelectronics Reliability April 2018 83:286-292
Databáze: ScienceDirect