Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis
| Autor: | Chen, C.Q., Ang, G.B., Ng, P.T., Rivai, Francis, Ng, H.P., Quah, A.C.T., Teo, Angela, Lam, Jeffery, Mai, Z.H. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:261-266 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect