Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition
| Autor: | Calienes, W.E., de Aguiar, Y.Q., Meinhardt, C., Vladimirescu, A., Reis, R. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:655-659 |
| Databáze: | ScienceDirect |
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