Electrical and thermal failure modes of 600 V p-gate GaN HEMTs
Autor: | Oeder, Thorsten, Castellazzi, Alberto, Pfost, Martin |
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Zdroj: | In Microelectronics Reliability September 2017 76-77:321-326 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Oeder, Thorsten, Castellazzi, Alberto, Pfost, Martin |
---|---|
Zdroj: | In Microelectronics Reliability September 2017 76-77:321-326 |
Databáze: | ScienceDirect |
Externí odkaz: |