Operation of 4H-SiC high voltage normally-OFF V-JFET in radiation hard conditions: Simulations and experiment
| Autor: | Popelka, S., Hazdra, P., Záhlava, V. |
|---|---|
| Zdroj: | In Microelectronics Reliability July 2017 74:58-66 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect