Highly reliable and low-power magnetic full-adder designs for nanoscale technologies
Autor: | Rajaei, Ramin |
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Zdroj: | In Microelectronics Reliability June 2017 73:129-135 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Rajaei, Ramin |
---|---|
Zdroj: | In Microelectronics Reliability June 2017 73:129-135 |
Databáze: | ScienceDirect |
Externí odkaz: |