A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels
| Autor: | Zhang, Peijian a, ⁎, Wu, Xue a, Yi, Qianning b, Chen, Wensuo a, Yang, Yonghui b, Zhu, Kunfeng b, Tan, Kaizhou a, Zhong, Yi b |
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| Zdroj: | In Microelectronics Reliability April 2017 71:86-90 |
| Databáze: | ScienceDirect |
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