Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node

Autor: Chatzikyriakou, Eleni, Redman-White, William, Groot, C.H. De
Zdroj: In Microelectronics Reliability January 2017 68:21-29
Databáze: ScienceDirect
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