The distributed thermal model of fin field effect transistor
| Autor: | Zubert, Mariusz, Raszkowski, Tomasz, Samson, Agnieszka, Janicki, Marcin, Napieralski, Andrzej |
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| Zdroj: | In Microelectronics Reliability December 2016 67:9-14 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect