RF measurements to pinpoint defects in inkjet-printed, thermally and mechanically stressed coplanar waveguides
| Autor: | Myllymäki, Sami, Putaala, Jussi, Hannu, Jari, Kunnari, Esa, Mäntysalo, Matti |
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| Zdroj: | In Microelectronics Reliability October 2016 65:142-150 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect