Fast and trusted intrinsic stress measurement to facilitate improved reliability assessments
| Autor: | Vogel, D., Auerswald, E., Gadhiya, Gh., Rzepka, S. |
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| Zdroj: | In Microelectronics Reliability September 2016 64:276-280 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect