Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes
| Autor: | Ndiaye, C., Huard, V., Federspiel, X., Cacho, F., Bravaix, A. |
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| Zdroj: | In Microelectronics Reliability September 2016 64:158-162 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect