Instability of oxide thin film transistor under electrical–mechanical hybrid stress for foldable display
| Autor: | Shin, Dongseok, Bae, Min Soo, Yun, Ilgu |
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| Zdroj: | In Microelectronics Reliability September 2016 64:109-112 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect