Optimization of contact metallizations for reliable wafer level Au[sbnd]Sn bonds
| Autor: | Vuorinen, V., Rautiainen, A., Heikkinen, H., Paulasto-Kröckel, M. |
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| Zdroj: | In Microelectronics Reliability September 2016 64:676-680 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect