Microstructural evolution of sintered silver at elevated temperatures
Autor: | Paknejad, Seyed Amir, Mansourian, Ali, Greenberg, Julian, Khtatba, Khalid, Van Parijs, Linde, Mannan, Samjid H. |
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Zdroj: | In Microelectronics Reliability August 2016 63:125-133 |
Databáze: | ScienceDirect |
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