Microstructural evolution of sintered silver at elevated temperatures

Autor: Paknejad, Seyed Amir, Mansourian, Ali, Greenberg, Julian, Khtatba, Khalid, Van Parijs, Linde, Mannan, Samjid H.
Zdroj: In Microelectronics Reliability August 2016 63:125-133
Databáze: ScienceDirect