Wafer level measurements and numerical analysis of self-heating phenomena in nano-scale SOI MOSFETs
| Autor: | Garegnani, Giacomo, Fiori, Vincent, Gouget, Gilles, Monsieur, Frederic, Tavernier, Clement |
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| Zdroj: | In Microelectronics Reliability August 2016 63:90-96 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect