Investigation on LDMOS-SCR with high holding current for high voltage ESD protection
| Autor: | Liang, Hailian, Bi, Xiuwen, Gu, Xiaofeng, Cao, Huafeng, Zhang, Yun |
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| Zdroj: | In Microelectronics Reliability June 2016 61:120-124 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect