Analysis of origin of measured 1/f noise in high-power semiconductor laser diodes far below threshold current
| Autor: | Guan, Jian, Guo, Shuxu, Wang, Jinyuan, Tao, Min, Cao, Junsheng, Gao, Fengli |
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| Zdroj: | In Microelectronics Reliability April 2016 59:55-59 |
| Databáze: | ScienceDirect |
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