Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment
| Autor: | Wang, X.Y., Zhang, H., Ma, X.P., Cheng, Q., Li, C.G., Li, M.X., Chen, T.N., Zhang, P., Shao, J.Q. |
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| Zdroj: | In Microelectronics Reliability February 2016 57:79-85 |
| Databáze: | ScienceDirect |
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